DIFFRACTION LINE BROADENING ANALYSIS OF SUPPORTED GOLD CATALYSTS. COMPARATIVE STUDY

V. MALINOVSCHI¹, S.MOGA¹, MIHAELA LAZAR², C. DUCU¹

¹University of Pitesti, Advanced Materials Research Centre, Romania
²National Institute for Research and Development of Isotopic and Molecular
Technologies, Romania
This e-mail address is being protected from spambots. You need JavaScript enabled to view it

 ABSTRACT

Distortions of the regular crystal lattice as well as a finite size of the coherently scattering domains lead to a significant broadening of the X-Ray diffraction line profile. By using physical model describing the individual types of broadening it is possible to relate the broadening of the X-Ray diffraction line profile to the microstructure of the material.
In this study a microstructural analysis of powder diffraction data was carried out for supported Au/SiO₂ catalysts, prepared by deposition-precipitation and impregnation methods, respectively [1,2]. The supported Au catalysts were studied using different X-ray line profile diffraction methods in order to obtain a number of interesting microstructural parameters. The line profile analysis methods gave similar size and strain values for the analyzed samples. The quantity of polycrystalline gold was calculated using the whole pattern fitting method.
Keywords: X-ray powder diffraction, line profile analysis, gold catalysts