QUANTITATIVE ANALYSIS AND METALIC COATING THICKNESS MEASUREMENTS BY X-RAY FLUORESCENCE Denis Negrea1, Catalin Ducu1, Viorel Malinovschi1, Sorin Moga1, 1University of Pitesti – Research Centre for Advanced Materials,
This paperwork covers the use of X-ray fluorescence (XRF) for determining the concentration and the coating thickness on metallic samples. The analysis method presented here may also be applicable to other coatings, providing that the elemental nature of the coating and substrate are compatible with the technical aspects of XRF, such as the absorption coefficient of the system, primary radiation, fluorescent radiation and type of detection. |